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The invention of the scanning tunneling microscope has led to an explosion of a family that is now called scanning probe microscopes (SPMs). The most popular instrument in this family is the atomic force microscope (AFM). According to some estimates, sales of SPMs in 1993 were about 100 million U.S. dollars (about 2,000 units installed to date) worldwide. The biggest portion of this results from AFM sales, although the first ideas and preliminary results were introduced to the scientific community only a few years ago (1986). The whole field of SPM is not very old (the first operation of STM was in 1981) and still is in a rapidly evolving state. The scientific industrial applications include quality control in the semiconductor industry and related research, molecular biology and chemistry, medical studies, materials science, and the field of information storage systems. Soon after the invention of the AFM it was discovered that part of the information in the images resulted from friction and that the instrument could be used as a tool for tribology. In general, SPMs are now used intensively in this field. Researchers can image single lubricant molecules and their agglomeration and measure surface topography, adhesion, friction, wear, lubricant film thickness, and mechanical properties all on a micrometer to nanometer scale. With the advent of more powerful computers, atomic-scale simulations have been conducted of tribological phenomena. Simulations have been able to predict the observed phenomena. Development of the field of micro/nanotribology has attracted numerous physicists and chemists. This is a field I personally know very little about. I am, however, very excited that SPMs have had such an immense impact on the field of tribology. I congratulate Professor Bharat Bhushan in helping to develop this field of micro/nanotribology. The Handbook of Micro/Nanotribology is very timely and I expect that it will be well received by the international scientific community. With best wishes.


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